Authors:
KABANOV Valentin Oleksandrovych
KRYVENKO Olena Vladyslavivna
LUTSENKO Vladyslav Ivanovych
SHUBNYI Oleksandr Ivanovych
REVIEWERS:
O.E. KOHUT, Dr of Physical and Mathematical Sciences, Professor
O.Ya. Usikov Institute for Radiophysics and Electronics, NAS of Ukraine
Y.V. PROKOPENKO, Doctor of Physical and Mathematical Sciences, Senior Research Fellow,
O.Ya. Usikov Institute for Radiophysics and Electronics, NAS of Ukraine
S.M. SHULGA, Doctor of Physical and Mathematical Sciences, Professor,
V.N. Karazin Kharkiv National University
This monograph examines the current challenges involved in determining the effect of the electromagnetic wave excitation caused by inhomogeneities on the characteristics of resonators to determine the complex dielectric permittivity of materials.
New types of resonant electrodynamic structures have been investigated, previously unknown physical regularities have been established, and a method for determining the imaginary part of the refractive index has been proposed. The scientific foundations have been developed to make active measurement systems based on solid-state millimetre-wave amplifiers and Gunn generators. New approaches have been proposed to develop highly sensitive microwave refractometers.
The material presented in this monograph may be of use to specialists conducting experimental studies of the dielectric properties of materials and the characteristics of atmospheric processes, as well as those involved in the development of monitoring methods in the oil and gas processing industries, environmental monitoring, and so on.
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